The Dynamic Parameter Power Semiconductor Test System DTS8765 is specifically designed for testing the complete range of semiconductor components like DIODEs, MOSFETs or IGBTs, from low voltage to high voltage DUTs.

The DTS provides all instruments to perform tests of dynamic semiconductor parameters, e. g. Saturated, Double Pulse, Desaturated and Short Circuit Test.

The integrated PXI platform and the open interfacing provides extension capabilities for additional testing requirements like DUT specific resistors-networks or temperature sensors. .

Key Features: up to 10.000 A, 1.500 V, Pulse > 10 ms