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PCIM Directory – Suppliers and Solutions for Power Electronics

Search and find – our supplier directory provides a comprehensive overview of industry players, featuring detailed profiles of the PCIM Expo exhibitors 2025 as well as the latest solutions and products in power electronics.

Overview

Cohu GmbH

cGator SiC & GaN - Power KGD Contactor

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You can find us here:

Address

Cohu GmbH
Geigelsteinstr. 6
83059 Kolbermoor
Germany

Telephone+49 8031 23370

About us

Cohu® is a global technology leader supplying test, automation, inspection & metrology products and services to the semiconductor industry. Cohu’s differentiated and broad product portfolio enables optimized yield and productivity, accelerating customers’ manufacturing time-to-market.

Our product groups

1. Test Equipment and Measurement Equipment
1. Development Tools and Test Tools
- Evaluation and Demonstration Boards
- Development and Testsystems (Hardware, Software, Hardware in the Loop)

More about us

Special Interests

Keywords

Probecard
Wide Band Gap
Test Equipment

Our Products

cGator SiC & GaN - Power KGD Contactor

cGator™ singulated power contactor is a top and bottom contacting solution for power Known Good Dies (KGD).

Cohu´s patent pending Volta-Flux™ MEMS probe architecture technology provides stable and low CRES for very challenging high-voltage and high-current requirements.

The gentle-touch feature reduces surface impacts to a minimum while providing a reliable contact force.

The Volta-Flux high-power density solution enables efficient die heat dissipation from top and bottom surface of the die under test.

MEMS probe technology enables smart stacking of pins to increase current carrying capability.

The cGator is designed to address the most common test parameters, for example:

Off-state tests: BVDSS
On-state tests: RDSon
Unclamped Inductive load Switching / Avalanchetests
Dynamic switching tests: Single pulse and double pulse inductive load switching

cStrider WBG SiC & GaN High Power Probecard

SiC and GaN wide bandgap wafer test up to 200°CInnovative pressure-level control during high-voltage test process increases probing efficiency on wafer edge up to 3000 Volts Scalable design provides flexibility to field-upgrade test parallelism from x1 up to x32Robust horizontal MEMS probes provide high current carrying capability up to 1000A per DieVolta-Flux Cartridge Design enables sustainable on-site single pin replacement with significant lower cost of test

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