ST System is a test equipment suitable to verify stability or drift of static parameters of discrete power semiconductors.

The system is defined “sequencer” because it allows to execute test measurements before and after a stress sequence (heating and cooling), on up to 60 devices in parallel, by a single start command.

It is featured with an interface to an automatic handler to automatically manipulate, contact and cool the devices under test (DUT).

ISO test system is a test equipment conceived to intercept discharges during HI-POT withstanding test. Its range is 5KV/10KV AC and 6KV DC with 10mA max current.

Programmable arc sensing will allow to avoid burn spots on device having discharges occurrence.

MT System is a configurable test equipment suitable to verify static and dynamic parameters of power semiconductors (i.e. IGBT, MOSFET, DIODE, THYRISTOR, SiC, GaN, etc) packaged and unpackaged (discrete, module, substrate and bare die).

The system can execute large sequence of measurements stored in a test program file by a single start command. Full traceability assured by datalog and/or STDF file. It is featured with an interface to any test handler to automatically manipulate packaged or unpackaged devices.

Selection of tester configuration and ranges allows full coverage of device parameters, up to 10KV-10KA on static and 6KV-18KA on dynamic ones, on all test stages starting at die level test to the final test on most complex 3L power modules