MT System is a configurable test equipment suitable to verify static and dynamic parameters of power semiconductors (i.e. IGBT, MOSFET, DIODE, THYRISTOR, SiC, GaN, etc) packaged and unpackaged (discrete, module, substrate and bare die).

The system can execute large sequence of measurements stored in a test program file by a single start command. Full traceability assured by datalog and/or STDF file. It is featured with an interface to any test handler to automatically manipulate packaged or unpackaged devices.

Selection of tester configuration and ranges allows full coverage of device parameters, up to 10KV-10KA on static and 6KV-18KA on dynamic ones, on all test stages starting at die level test to the final test on most complex 3L power modules