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Quasar200 and Pulsar600_Power Characterization Testers
Description
Quasar200 and Pulsar600_
Everything you need for fast measurements on SiC, GaN, Si devices and bare die
Wide bandgap (WBG) power devices such as SiC and GaN require a completely different approach to characterization than the previous generation of Si power products. Higher powers, significantly faster switching speeds and a wide range of necessary performance standards such as JESD 24-9, JESD 24-10 and AQG-324, all place new demands on the power analyser.
The Quasar200 and Pulsar600 Power Characterization Testers make it quick and easy to measure WBG power device performance.
Quasar200 is ideal for Si, GaN and lower power SiC testing. Pulsar600 is our ultimate characterization solution for ultra high current applications, particularly SiC, invertor and automative applications.
ipTEST are famous for testing the latest WBG devices at production speeds. Now enjoy the benefits in your characterization lab.
https://www.microtest.net/products/quasar200-and-pulsar600/
