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SEMI-CONDUCTOR CHARACTERISATION, RELIABILITY ASSESSMENT & AGING MEASUREMENT
Description
Our team has extensive experience in the characterisation of SiC devices, developing gate drivers, and using SiC devices in various MV converter & SST applications.
We are working to understand the EMI and reliability issues associated with fast transients common to SiC devices.
With our dedicated laboratory for semiconductor aging, we design component aging test protocols and develop condition health monitoring (CHM) algorithms.
https://www.supergrid-institute.com/test-platforms/power-switches-characterisation/


